6 results
A new planar defect in SiGe nanopillars
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1948-1949
- Print publication:
- August 2021
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Quantify doping efficiency at the nanoscale using monochromated STEM-EELS
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 310-311
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- August 2021
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Carrier Collective Excitations in Degenerate Semiconductors Studied by EELS
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 1924-1926
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- August 2020
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Local materials and know-how key to sub-Saharan Africa’s energy shift
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- Journal:
- MRS Bulletin / Volume 41 / Issue 9 / September 2016
- Published online by Cambridge University Press:
- 08 September 2016, pp. 656-657
- Print publication:
- September 2016
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Ion scattering studies of high-K gate stacks: thermal stability and interdiffusion
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- Journal:
- MRS Online Proceedings Library Archive / Volume 967 / 2006
- Published online by Cambridge University Press:
- 11 June 2019, 967-U01-05
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- 2006
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Materials Characterization of Alternative Gate Dielectrics
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- Journal:
- MRS Bulletin / Volume 27 / Issue 3 / March 2002
- Published online by Cambridge University Press:
- 31 January 2011, pp. 206-211
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- March 2002
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